- Patent Title: Inspection information prediction apparatus, inspection apparatus, and non-transitory computer readable medium storing inspection information prediction program
-
Application No.: US16255840Application Date: 2019-01-24
-
Publication No.: US10969770B2Publication Date: 2021-04-06
- Inventor: Takashi Hatakeyama , Nobuhide Inaba , Shuhei Kobayakawa , Masafumi Kudo
- Applicant: FUJI XEROX CO., LTD.
- Applicant Address: JP Tokyo
- Assignee: FUJI XEROX CO., LTD.
- Current Assignee: FUJI XEROX CO., LTD.
- Current Assignee Address: JP Tokyo
- Agency: JCIPRNET
- Priority: JPJP2018-178537 20180925
- Main IPC: G05B19/418
- IPC: G05B19/418

Abstract:
An inspection information prediction apparatus includes an environment-information acquisition unit that acquires environment information of a routing step through which an inspection target has been routed before an inspection step of inspecting the inspection target, a manufacturing-information acquisition unit that acquires manufacturing information of the inspection target, and a prediction unit that predicts inspection information which indicates an inspection result of an inspection portion of the inspection target determined by the manufacturing information and is obtained by applying the environment information, based on the manufacturing information of the inspection target and the environment information of the routing step through which the inspection target has been routed.
Public/Granted literature
Information query
IPC分类: