Invention Grant
- Patent Title: Semiconductor package and method of fabricating semiconductor package
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Application No.: US16396793Application Date: 2019-04-29
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Publication No.: US10937688B2Publication Date: 2021-03-02
- Inventor: Zi-Jheng Liu , Chen-Cheng Kuo , Hung-Jui Kuo
- Applicant: Taiwan Semiconductor Manufacturing Co., Ltd.
- Applicant Address: TW Hsinchu
- Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.
- Current Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.
- Current Assignee Address: TW Hsinchu
- Agency: JCIPRNET
- Main IPC: H01L23/053
- IPC: H01L23/053 ; H01L21/768 ; H01L21/56 ; H01L21/02 ; H01L23/538 ; H01L21/78 ; H01L23/532 ; H01L23/31 ; H01L23/00

Abstract:
A method of fabricating a semiconductor package includes providing a substrate having at least one contact and forming a redistribution layer on the substrate. The formation of the redistribution layer includes forming a dielectric material layer over the substrate and performing a double exposure process to the dielectric material layer. A development process is then performed and a dual damascene opening is formed in the dielectric material layer. A seed metallic layer is formed over the dual damascene opening and over the dielectric material layer. A metal layer is formed over the seed metallic layer. A redistribution pattern is formed in the first dual damascene opening and is electrically connected with the at least one contact.
Public/Granted literature
- US20190295884A1 SEMICONDUCTOR PACKAGE AND METHOD OF FABRICATING SEMICONDUCTOR PACKAGE Public/Granted day:2019-09-26
Information query
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