Invention Grant
- Patent Title: Holder and charged particle beam apparatus
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Application No.: US16992430Application Date: 2020-08-13
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Publication No.: US10937626B2Publication Date: 2021-03-02
- Inventor: Kotaro Hosoya
- Applicant: HITACHI HIGH-TECH CORPORATION
- Applicant Address: JP Tokyo
- Assignee: HITACHI HIGH-TECH CORPORATION
- Current Assignee: HITACHI HIGH-TECH CORPORATION
- Current Assignee Address: JP Tokyo
- Agency: Mattingly & Malur, PC
- Main IPC: H01J37/20
- IPC: H01J37/20 ; H01J37/244 ; H01J37/22 ; H01J37/26

Abstract:
According to one embodiment, a holder includes a top member, a side member, and a bottom member. The top member has a hole for allowing transmission of a charged particle beam, and the sample is mountable in the hole. The bottom member is provided to overlap with the top member in a plan view. The side member is connected to a part of the top member and a part of the bottom member such that the top member and the bottom member are separated from each other in a cross-sectional view. An opening portion is a region surrounded by the top member, the side member, and the bottom member, and a scintillator is provided in the opening portion.
Public/Granted literature
- US20200373119A1 HOLDER AND CHARGED PARTICLE BEAM APPARATUS Public/Granted day:2020-11-26
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