Invention Grant
- Patent Title: Nonvolatile memory including duty correction circuit and storage device including the nonvolatile memory
-
Application No.: US16668685Application Date: 2019-10-30
-
Publication No.: US10937474B2Publication Date: 2021-03-02
- Inventor: Jung-june Park , Jeong-don Ihm , Byung-hoon Jeong , Eun-ji Kim , Ji-yeon Shin , Young-don Choi
- Applicant: Samsung Electronics Co., Ltd.
- Applicant Address: KR Suwon-si
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Suwon-si
- Agency: Harness, Dickey & Pierce, P.L.C.
- Priority: KR10-2017-0097815 20170801
- Main IPC: G11C7/22
- IPC: G11C7/22 ; G11C16/32 ; G11C7/10 ; G11C16/26 ; H03K3/017 ; H03K5/156

Abstract:
Provided is a nonvolatile memory including a clock pin configured to receive an external clock signal during a duty correction circuit training period; a plurality of memory chips configured to perform a duty correction operation on an internal clock signal based on the external clock signal, the plurality of memory chips configured to perform the duty correction operation in parallel during the training period; and an input/output pin commonly connected to the plurality of memory chips, wherein each of the plurality of memory chips includes: a duty correction circuit (DCC) configured to perform the duty correction operation on the internal clock signal; and an output buffer connected between an output terminal of the DCC and the input/output pin.
Public/Granted literature
- US20200066317A1 NONVOLATILE MEMORY INCLUDING DUTY CORRECTION CIRCUIT AND STORAGE DEVICE INCLUDING THE NONVOLATILE MEMORY Public/Granted day:2020-02-27
Information query