Invention Grant
- Patent Title: Recognition method of pattern feature
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Application No.: US16386216Application Date: 2019-04-16
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Publication No.: US10916006B2Publication Date: 2021-02-09
- Inventor: Ching-Ya Huang , Tso-Hua Hung
- Applicant: Winbond Electronics Corp.
- Applicant Address: TW Taichung
- Assignee: Winbond Electronics Corp.
- Current Assignee: Winbond Electronics Corp.
- Current Assignee Address: TW Taichung
- Agency: JCIPRNET
- Main IPC: G06T7/00
- IPC: G06T7/00 ; G06T7/50 ; G06K9/62 ; G06T7/66

Abstract:
A recognition method of pattern feature is provided, where a recognition result thereof is applied to optical proximity correction, the method includes: providing a plurality of reference images with a reference pattern feature; recognizing and classifying the reference images by an image recognition device, and storing the recognition result; comparing the image with the actual pattern feature with the stored recognition result by the image recognition device to recognize and classify the image with the actual pattern feature; and calculating an angle feature value and/or a distance feature value of the actual pattern feature by the image recognition device according to a classification result to obtain the recognition result of the pattern feature.
Public/Granted literature
- US20200334799A1 RECOGNITION METHOD OF PATTERN FEATURE Public/Granted day:2020-10-22
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