Invention Grant
- Patent Title: Apparatus and methods for calibrating analog circuitry in an integrated circuit
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Application No.: US16140292Application Date: 2018-09-24
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Publication No.: US10911164B2Publication Date: 2021-02-02
- Inventor: Neville Carvalho , Tim Tri Hoang , Sergey Shumarayev
- Applicant: Altera Corporation
- Applicant Address: US CA San Jose
- Assignee: Altera Corporation
- Current Assignee: Altera Corporation
- Current Assignee Address: US CA San Jose
- Main IPC: H04B17/21
- IPC: H04B17/21 ; H04B17/11 ; G01R35/00 ; G12B13/00

Abstract:
The present disclosure provides apparatus and methods for the calibration of analog circuitry on an integrated circuit. One embodiment relates to a method of calibrating analog circuitry within an integrated circuit. A microcontroller that is embedded in the integrated circuit is booted up. A reset control signal is sent to reset an analog circuit in the integrated circuit, and a response signal for the analog circuit is monitored by the microcontroller. Based on the response signal, a calibration parameter for the analog circuit is determined, and the analog circuit is 10 configured using the calibration parameter. Other embodiments, aspects and features are also disclosed.
Public/Granted literature
- US20190028213A1 APPARATUS AND METHODS FOR CALIBRATING ANALOG CIRCUITRY IN AN INTEGRATED CIRCUIT Public/Granted day:2019-01-24
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