Invention Grant
- Patent Title: Feature extraction element, feature extraction system, and determination apparatus
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Application No.: US16145875Application Date: 2018-09-28
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Publication No.: US10904471B2Publication Date: 2021-01-26
- Inventor: Shigeru Matsumoto , Sota Nakanishi , Tomohisa Ishida , Atsushi Miyamoto , Kiyoshi Uchikawa
- Applicant: NIKON CORPORATION
- Applicant Address: JP Tokyo
- Assignee: NIKON CORPORATION
- Current Assignee: NIKON CORPORATION
- Current Assignee Address: JP Tokyo
- Main IPC: H04N5/369
- IPC: H04N5/369 ; G06N3/04 ; H04N5/3745 ; H01L27/146 ; G06N3/063 ; G06K9/20 ; G06K9/46 ; G06K9/78 ; H04N5/378

Abstract:
A feature extracting element including: a light-receiving substrate where a plurality of light-receiving elements for photoelectrically converting received light are two-dimensionally arrayed; and one or more other substrates that are laminated on the light-receiving substrate, wherein the other substrate has: a convolution processor which has a plurality of multiplying circuits that are correspondingly provided per the light-receiving element or per a block that is configured of a plurality of the light-receiving elements, and performs convolution operation on signals that are output from the plurality of light-receiving elements using the plurality of multiplying circuits; a pooling processing unit to sample a signal that is output from the convolution processor, based on a predetermined condition; and a connection wiring to pass the sampled signal to the plurality of multiplying circuits.
Public/Granted literature
- US20190034748A1 FEATURE EXTRACTION ELEMENT, FEATURE EXTRACTION SYSTEM, AND DETERMINATION APPARATUS Public/Granted day:2019-01-31
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