Invention Grant
- Patent Title: Method of forming semiconductor device
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Application No.: US16211239Application Date: 2018-12-06
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Publication No.: US10825818B2Publication Date: 2020-11-03
- Inventor: Feng-Yi Chang , Fu-Che Lee , Chieh-Te Chen
- Applicant: UNITED MICROELECTRONICS CORP. , Fujian Jinhua Integrated Circuit Co., Ltd.
- Applicant Address: TW Hsin-Chu CN Quanzhou
- Assignee: UNITED MICROELECTRONICS CORP.,Fujian Jinhua Integrated Circuit Co., Ltd.
- Current Assignee: UNITED MICROELECTRONICS CORP.,Fujian Jinhua Integrated Circuit Co., Ltd.
- Current Assignee Address: TW Hsin-Chu CN Quanzhou
- Agent Winston Hsu
- Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@382901d7
- Main IPC: H01L27/108
- IPC: H01L27/108 ; H01L21/768

Abstract:
A semiconductor device and method of forming the same, the semiconductor device includes bit lines, a transistor, a dielectric layer, plugs and a capping layer. The bit lines are disposed on a substrate within a cell region thereof, and the transistor is disposed on the substrate within a periphery region. The plugs are disposed in the dielectric layer, within the cell region and the periphery region respectively. The capping layer is disposed on the dielectric layer, and the capping layer disposed within the periphery region is between those plugs. That is, a portion of the dielectric layer is therefore between the capping layer and the transistor.
Public/Granted literature
- US20190109138A1 METHOD OF FORMING SEMICONDUCTOR DEVICE Public/Granted day:2019-04-11
Information query
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