• Patent Title: Signal processing method and system based on time-of-flight mass spectrometry and electronic apparatus
  • Application No.: US16095747
    Application Date: 2017-06-12
  • Publication No.: US10825670B2
    Publication Date: 2020-11-03
  • Inventor: Jiaqi ShenWenjian SunXiaoqiang Zhang
  • Applicant: SHIMADZU CORPORATION
  • Applicant Address: JP Kyoto
  • Assignee: SHIMADZU CORPORATION
  • Current Assignee: SHIMADZU CORPORATION
  • Current Assignee Address: JP Kyoto
  • Agency: Locke Lord LLP
  • Agent Tim Tingkang Xia, Esq.
  • Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@30b99a7f
  • International Application: PCT/JP2017/021578 WO 20170612
  • International Announcement: WO2018/003465 WO 20180104
  • Main IPC: H01J49/00
  • IPC: H01J49/00 H01J49/40
Signal processing method and system based on time-of-flight mass spectrometry and electronic apparatus
Abstract:
The invention provides signal processing method and system and an electronic apparatus for analysis of time-of-flight mass spectra. The method includes digitalizing an analog signal output from an ion detector to acquire complete raw time-of-flight spectra or each effective part in the raw time-of-flight spectra for a plurality of times; if the complete raw time-of-flight spectra are acquired, extracting the effective parts of each raw time-of-flight spectrum; applying a one-dimensional wavelet transform to each effective part to map to each frequency band or scale; determining positions and intensities of each spectral peak in each raw time-of-flight spectrum by detecting the maxima of an obtained wavelet coefficient distribution, and saving said peak position and intensity as characteristic data of each spectral peak; accumulating the characteristic data obtained by processing each raw time-of-flight spectrum and stacking the data to form spectral peak intensity/time-of-flight histogram.
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