Invention Grant
- Patent Title: Signal processing method and system based on time-of-flight mass spectrometry and electronic apparatus
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Application No.: US16095747Application Date: 2017-06-12
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Publication No.: US10825670B2Publication Date: 2020-11-03
- Inventor: Jiaqi Shen , Wenjian Sun , Xiaoqiang Zhang
- Applicant: SHIMADZU CORPORATION
- Applicant Address: JP Kyoto
- Assignee: SHIMADZU CORPORATION
- Current Assignee: SHIMADZU CORPORATION
- Current Assignee Address: JP Kyoto
- Agency: Locke Lord LLP
- Agent Tim Tingkang Xia, Esq.
- Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@30b99a7f
- International Application: PCT/JP2017/021578 WO 20170612
- International Announcement: WO2018/003465 WO 20180104
- Main IPC: H01J49/00
- IPC: H01J49/00 ; H01J49/40

Abstract:
The invention provides signal processing method and system and an electronic apparatus for analysis of time-of-flight mass spectra. The method includes digitalizing an analog signal output from an ion detector to acquire complete raw time-of-flight spectra or each effective part in the raw time-of-flight spectra for a plurality of times; if the complete raw time-of-flight spectra are acquired, extracting the effective parts of each raw time-of-flight spectrum; applying a one-dimensional wavelet transform to each effective part to map to each frequency band or scale; determining positions and intensities of each spectral peak in each raw time-of-flight spectrum by detecting the maxima of an obtained wavelet coefficient distribution, and saving said peak position and intensity as characteristic data of each spectral peak; accumulating the characteristic data obtained by processing each raw time-of-flight spectrum and stacking the data to form spectral peak intensity/time-of-flight histogram.
Public/Granted literature
- US20190172694A1 SIGNAL PROCESSING METHOD AND SYSTEM BASED ON TIME-OF-FLIGHT MASS SPECTROMETRY AND ELECTRONIC APPARATUS Public/Granted day:2019-06-06
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