Invention Grant
- Patent Title: Fail redundancy circuits
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Application No.: US16460270Application Date: 2019-07-02
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Publication No.: US10778226B1Publication Date: 2020-09-15
- Inventor: Geun Ho Choi , Min Gyu Park
- Applicant: SK hynix Inc.
- Applicant Address: KR Icheon-si, Gyeonggi-do
- Assignee: SK hynix Inc.
- Current Assignee: SK hynix Inc.
- Current Assignee Address: KR Icheon-si, Gyeonggi-do
- Agency: William Park & Associates Ltd.
- Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@328cd71
- Main IPC: G11C7/00
- IPC: G11C7/00 ; H03K19/007 ; G11C29/00 ; G11C8/18

Abstract:
A redundancy circuit includes a selection control signal generation circuit and a column control circuit. The selection control signal generation circuit drives an internal node, which is initialized, to generate a selection control signal when a logic level of a latched address signal is different from a logic level of a fuse signal. The column control circuit buffers a pre-column selection signal based on the selection control signal to generate a column selection signal for execution of a column operation of cells or to generate a redundancy column selection signal for execution of the column operation of redundancy cells.
Public/Granted literature
- US20200287544A1 FAIL REDUNDANCY CIRCUITS Public/Granted day:2020-09-10
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