Invention Grant
- Patent Title: System and method to monitor glitch energy
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Application No.: US15842544Application Date: 2017-12-14
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Publication No.: US10770261B2Publication Date: 2020-09-08
- Inventor: Larry G. Nelson, Sr. , Klaus Petry
- Applicant: Varian Semiconductor Equipment Associates, Inc.
- Applicant Address: US MA Gloucester
- Assignee: Varian Semiconductor Equipment Associates, Inc.
- Current Assignee: Varian Semiconductor Equipment Associates, Inc.
- Current Assignee Address: US MA Gloucester
- Agency: Nields, Lemack & Frame, LLC
- Main IPC: H01J37/24
- IPC: H01J37/24 ; H01J37/248 ; G21K5/04 ; G01R19/165 ; G01R31/12 ; G01R19/17

Abstract:
A system and method for monitoring glitch frequency and energy is disclosed. The system includes a glitch capture module that monitors the voltage of a biased component and captures any glitches that occur. The glitch capture module also extends the duration of that glitch so that the controller is guaranteed to observe this glitch. In certain embodiments, the glitch capture module captures the maximum energy of the glitch by storing the minimum voltage, in terms of magnitude, of the glitch.
Public/Granted literature
- US20190189390A1 System And Method To Monitor Glitch Energy Public/Granted day:2019-06-20
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