Invention Grant
- Patent Title: Antenna apparatus and measurement method
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Application No.: US16591047Application Date: 2019-10-02
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Publication No.: US10763979B2Publication Date: 2020-09-01
- Inventor: Tomohiko Maruo , Aya Yamamoto
- Applicant: ANRITSU CORPORATION
- Applicant Address: JP Kanagawa
- Assignee: ANRITSU CORPORATION
- Current Assignee: ANRITSU CORPORATION
- Current Assignee Address: JP Kanagawa
- Agency: Pearne & Gordon LLP
- Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@abc9b47
- Main IPC: H04B17/00
- IPC: H04B17/00 ; H04B17/15 ; H01Q15/14 ; H01Q3/18

Abstract:
An measurement apparatus (antenna apparatus) 1 includes: an OTA chamber 50 having an internal space 51 that is not influenced by the surrounding radio wave environment; a reflector 7 that is housed in the internal space 51, radio signals transmitted or received by an antenna 110 of a DUT 100 being reflected through a paraboloid of revolution; a plurality of test antennas 6 that use radio signals in a plurality of measurement target frequency bands for measuring the transmission and reception characteristics of the DUT 100; and automatic antenna arrangement means 60 for sequentially arranging each of the test antennas 6 at a focal position F, which is determined from the paraboloid of revolution, according to the measurement target frequency bands.
Public/Granted literature
- US20200177289A1 ANTENNA APPARATUS AND MEASUREMENT METHOD Public/Granted day:2020-06-04
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