Invention Grant
- Patent Title: Semiconductor device and manufacturing method thereof
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Application No.: US16101566Application Date: 2018-08-13
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Publication No.: US10763208B2Publication Date: 2020-09-01
- Inventor: Jhon-Jhy Liaw
- Applicant: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
- Applicant Address: TW Hsinchu
- Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
- Current Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
- Current Assignee Address: TW Hsinchu
- Agency: McClure, Qualey & Rodack, LLP
- Main IPC: H01L23/522
- IPC: H01L23/522 ; H01L23/532 ; H01L27/092 ; H01L21/768 ; H01L21/311

Abstract:
A semiconductor device includes a semiconductor substrate, a metal layer, a dielectric layer, and a via. The metal layer is disposed above the semiconductor substrate. The dielectric layer is disposed between the metal layer and the semiconductor substrate. The via is embedded in the dielectric layer and comprises a first portion and a second portion between the first portion and the semiconductor substrate. The first portion of the via has a first width. The second portion of the via has a second width greater than the first width of the first portion.
Public/Granted literature
- US20200051906A1 SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF Public/Granted day:2020-02-13
Information query
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