Invention Grant
- Patent Title: Analyzing apparatus
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Application No.: US15539413Application Date: 2014-12-25
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Publication No.: US10763094B2Publication Date: 2020-09-01
- Inventor: Shinichi Yamaguchi , Yoshikatsu Umemura , Masahiro Ikegami , Koji Tanaka
- Applicant: SHIMADZU CORPORATION
- Applicant Address: JP Kyoto-shi, Kyoto
- Assignee: SHIMADZU CORPORATION
- Current Assignee: SHIMADZU CORPORATION
- Current Assignee Address: JP Kyoto-shi, Kyoto
- Agency: Sughrue Mion, PLLC
- International Application: PCT/JP2014/084281 WO 20141225
- International Announcement: WO2016/103388 WO 20160630
- Main IPC: H01J49/00
- IPC: H01J49/00 ; G01N30/46 ; G01N30/72 ; G01N30/86

Abstract:
For every acquisition of a set of mass spectrum data, a mass calibrator (determines the amount of mass discrepancy using the appearance position of a peak originating from an internal standard substance having a known m/z value, and performs a process for correcting the mass discrepancy. A mass calibration information collector (collects the amount of mass discrepancy or mass correction quantity for each set of mass spectrum data. After the completion of the measurement, a three-dimensional display information creator creates a three-dimensional graph showing the large number of collected mass correction quantities plotted in a three-dimensional space in which the retention time in a primary column and the retention time in a secondary column in a comprehensive two-dimensional LC unit are represented by two mutually orthogonal axes while the mass correction quantity is represented by the axis orthogonal to those two axes.
Public/Granted literature
- US20180218892A1 ANALYTICAL DEVICE Public/Granted day:2018-08-02
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