Invention Grant
- Patent Title: Accessible accumulated memory temperature readings in a memory sub-system
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Application No.: US16121558Application Date: 2018-09-04
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Publication No.: US10761769B2Publication Date: 2020-09-01
- Inventor: Gerald L. Cadloni , Bruce A. Liikanen
- Applicant: Micron Technology, Inc.
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Perkins Coie LLP
- Main IPC: G06F12/00
- IPC: G06F12/00 ; G06F3/06

Abstract:
A memory sub-system is disclosed that makes accessible accumulated memory temperature statistics in relation to a target memory portion. This can be accomplished by maintaining one or more hold variables and one or more accumulation variables. The accumulation variables can be iteratively updated upon triggers such as a timer expiration or I/O event. Updating the accumulation variables can include obtaining a current temperature and tracking one or more of: a maximum, minimum, and mean temperature across the iterations. An accumulation value can track how many times the accumulation variables have been updated. When the accumulation value reaches an accumulation action threshold, the current state of the accumulation variables can be used to update the hold variables. The accumulation value and accumulation variables can then be reset and used for accumulation of additional temperature statistics.
Public/Granted literature
- US20200073577A1 ACCESSIBLE ACCUMULATED MEMORY TEMPERATURE READINGS IN A MEMORY SUB-SYSTEM Public/Granted day:2020-03-05
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