- Patent Title: Scan frequency modulation based on memory density or block usage
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Application No.: US16195743Application Date: 2018-11-19
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Publication No.: US10761727B2Publication Date: 2020-09-01
- Inventor: Vamsi Pavan Rayaprolu , Sampath K. Ratnam , Harish R. Singidi , Ashutosh Malshe , Kishore Kumar Muchherla
- Applicant: Micron Technology, Inc.
- Applicant Address: US ID Boise
- Assignee: MICRON TECHNOLOGY, INC.
- Current Assignee: MICRON TECHNOLOGY, INC.
- Current Assignee Address: US ID Boise
- Agency: Lowenstein Sandler LLP
- Main IPC: G06F3/06
- IPC: G06F3/06

Abstract:
A region of a memory component is determined to include a type of memory. A frequency to perform an operation on the region of the memory component is determined based on the type of memory. The operation is performed on a memory cell at the region of the memory component at the determined frequency to transition the memory cell from a state associated with an increased error rate for data stored at the memory cell to another state associated with a decreased error rate for the data stored at the memory cell.
Public/Granted literature
- US20200159410A1 SCAN FREQUENCY MODULATION BASED ON MEMORY DENSITY OR BLOCK USAGE Public/Granted day:2020-05-21
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