Invention Grant
- Patent Title: Tandem mass spectrometer and program for the same
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Application No.: US16480489Application Date: 2018-02-28
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Publication No.: US10741372B2Publication Date: 2020-08-11
- Inventor: Atsuhiko Toyama , Hideki Yamamoto
- Applicant: SHIMADZU CORPORATION
- Applicant Address: JP Kyoto-shi, Kyoto
- Assignee: SHIMADZU CORPORATION
- Current Assignee: SHIMADZU CORPORATION
- Current Assignee Address: JP Kyoto-shi, Kyoto
- Agency: Sughrue Mion, PLLC
- Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@6f79b1cb
- International Application: PCT/JP2018/007423 WO 20180228
- International Announcement: WO2018/163926 WO 20180913
- Main IPC: H01J49/00
- IPC: H01J49/00 ; H01J49/06 ; H01J49/16 ; H01J49/40 ; H01J49/42

Abstract:
As soon as a set of data is acquired by a mass spectrometric analysis, an accumulated value of the signal intensity on the mass spectrum is calculated for each m/z segment obtained by dividing the entire m/z range covered by the measurement by a predetermined m/z width. Only the m/z segments with accumulated signal-intensity values equal to or greater than a predetermined threshold are selected as the target for an MS/MS analysis. MS/MS analysis is performed for each selected m/z segment, using ions whose m/z values fall within the m/z segment as precursor ions. A measurement cycle which includes mass spectrometric analysis performed one time and MS/MS analysis performed one or more times is repeated. After that, ions originating from the same component are selected based on the retention time of a peak in an extracted ion chromatogram created for each product ion, and the component is identified.
Public/Granted literature
- US20200013599A1 TANDEM MASS SPECTROMETER AND PROGRAM FOR THE SAME Public/Granted day:2020-01-09
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