Invention Grant
- Patent Title: Measurement support apparatus and measurement support method
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Application No.: US16015693Application Date: 2018-06-22
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Publication No.: US10740892B2Publication Date: 2020-08-11
- Inventor: Shunichiro Nonaka , Masashi Kuranoshita
- Applicant: FUJIFILM Corporation
- Applicant Address: JP Tokyo
- Assignee: FUJIFILM Corporation
- Current Assignee: FUJIFILM Corporation
- Current Assignee Address: JP Tokyo
- Agency: Studebaker & Brackett PC
- Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@30826a9b
- Main IPC: G06T7/00
- IPC: G06T7/00 ; G01B11/02 ; G01C11/00 ; H04N13/239 ; G01M5/00 ; G06T11/00 ; G06T7/73 ; G06T7/593 ; G01N21/88 ; G06T7/60 ; H04N5/232 ; E01D22/00 ; G06T11/60

Abstract:
A measurement support apparatus includes an image acquisition unit; a scale image generation unit, the scale image representing a scale assigned at least one of gradations for measuring a length of the crack or line drawings and numerals for measuring a width of the crack; and an image display unit that displays the image of the structure and the scale image in a superimposed manner in a display area, in which the scale image generation unit generates a scale image in accordance with a distance between the image acquisition unit and the measurement surface and an orientation of the measurement surface, and the image display unit displays the generated scale image in the superimposed manner at a position according to a position of the crack in the image of the structure in a direction according to a direction of the crack in the image of the structure.
Public/Granted literature
- US20180300867A1 MEASUREMENT SUPPORT APPARATUS AND MEASUREMENT SUPPORT METHOD Public/Granted day:2018-10-18
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