Invention Grant
- Patent Title: Test program data key generation
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Application No.: US16059322Application Date: 2018-08-09
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Publication No.: US10733071B2Publication Date: 2020-08-04
- Inventor: Louis P. Gomes
- Applicant: INTERNATIONAL BUSINESS MACHINES CORPORATION
- Applicant Address: US NY Armonk
- Assignee: INTERNATIONAL BUSINESS MACHINES CORPORATION
- Current Assignee: INTERNATIONAL BUSINESS MACHINES CORPORATION
- Current Assignee Address: US NY Armonk
- Agency: Cantor Colburn LLP
- Agent Teddi Maranzano
- Main IPC: G06F11/00
- IPC: G06F11/00 ; G06F11/263 ; G06F11/36 ; G06F7/58

Abstract:
Systems, methods, and computer-readable media are disclosed for providing a test program with the capability to build and execute instructions and their functions (test streams) that have experienced failure so as to reproduce output errors as desired and improve the chances of determining the cause of the output errors. The test program allows a user to provide a data key seed that was used during a prior pass of the test program that produced an error output and a data key generation frequency value (N) that would be used to generate new program and data seeds every N passes of the test program. The user-provided key seed can be used to regenerate the same data keys that were generated in the prior test program pass that produced the error output. This mechanism enables the test program to recreate the same test stream of the error output from the prior pass.
Public/Granted literature
- US20200019481A1 TEST PROGRAM DATA KEY GENERATION Public/Granted day:2020-01-16
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