Invention Grant
- Patent Title: Semiconductor device and error management method
-
Application No.: US15854191Application Date: 2017-12-26
-
Publication No.: US10733049B2Publication Date: 2020-08-04
- Inventor: Woongrae Kim
- Applicant: SK hynix Inc.
- Applicant Address: KR Icheon-si, Gyeonggi-do
- Assignee: SK hynix Inc.
- Current Assignee: SK hynix Inc.
- Current Assignee Address: KR Icheon-si, Gyeonggi-do
- Agency: William Park & Associates Ltd.
- Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@4d638a89
- Main IPC: G06F11/00
- IPC: G06F11/00 ; G06F11/10 ; G11C29/52 ; G11C29/42 ; G11C29/44 ; G06F12/02 ; G11C29/00

Abstract:
An error management system may be provided. The error management system may include an error analysis unit configured to generate error correction counting values by counting error correction occurrences in a plurality of management blocks and generate permanent error block information for defining whether errors generated in the plurality of management blocks are a permanent error or a temporary error by comparing the error correction counting values and at least one reference value. The error management system may include a block control unit configured to replace an address signal with a new address signal when a management block selected according to the address signal among the plurality of management blocks is previously designated in the permanent error block information.
Public/Granted literature
- US20180373594A1 SEMICONDUCTOR DEVICE AND ERROR MANAGEMENT METHOD Public/Granted day:2018-12-27
Information query