Invention Grant
- Patent Title: Inspection system and inspection method
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Application No.: US16232126Application Date: 2018-12-26
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Publication No.: US10732078B2Publication Date: 2020-08-04
- Inventor: Manabu Watanabe , Akihiro Matsuzaki , Fumio Sato , Fujio Terai , Hitoshi Katayama , Yuichiro Gunji
- Applicant: KABUSHIKI KAISHA TOSHIBA , Toshiba Energy Systems & Solutions Corporation
- Applicant Address: JP Minato-ku JP Kawasaki-shi
- Assignee: KABUSHIKI KAISHA TOSHIBA,Toshiba Energy Systems & Solutions Corporation
- Current Assignee: KABUSHIKI KAISHA TOSHIBA,Toshiba Energy Systems & Solutions Corporation
- Current Assignee Address: JP Minato-ku JP Kawasaki-shi
- Agency: Oblon, McClelland, Maier & Neustadt, L.L.P.
- Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@522f4e5d
- Main IPC: G01M99/00
- IPC: G01M99/00 ; H02K11/35 ; H02K15/00 ; H02K9/08 ; H02K7/08 ; H02K7/18 ; H02K5/16

Abstract:
According to an embodiment, an inspection system comprises: a moving body including a moving main body movable along a structure; a detector attached to the moving main body; a shape information storage unit for storing shape information indicating shape and size of the structure; an inspection location information storage unit for storing information of inspection locations to be inspected; an inspection item information storage unit for storing information of inspection items to be inspected; a moving body location detecting unit for detecting moving body location information indicating location of the moving body; a moving control unit for controlling movement of the moving body; and an inspection control unit for inspection.
Public/Granted literature
- US20190195740A1 INSPECTION SYSTEM AND INSPECTION METHOD Public/Granted day:2019-06-27
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