Invention Grant
- Patent Title: Read threshold voltage selection
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Application No.: US16459953Application Date: 2019-07-02
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Publication No.: US10706897B2Publication Date: 2020-07-07
- Inventor: Chandra C. Varanasi
- Applicant: Micron Technology, Inc.
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Brooks, Cameron & Huebsch, PLLC
- Main IPC: G11C7/00
- IPC: G11C7/00 ; G06F11/10 ; G11C29/52 ; G11C7/14

Abstract:
Apparatuses and methods for read threshold voltage selection are provided. One example method can include setting a first soft read threshold voltage and a second soft read threshold voltage based on a difference between a first number of memory cells that are read as being programmed to a first state when read using a first threshold voltage and a second number of memory that are read as being programmed to the first state when read using another threshold voltage.
Public/Granted literature
- US20190325921A1 READ THRESHOLD VOLTAGE SELECTION Public/Granted day:2019-10-24
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