Invention Grant
- Patent Title: Measuring wall thickness loss for a structure
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Application No.: US15632725Application Date: 2017-06-26
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Publication No.: US10704901B2Publication Date: 2020-07-07
- Inventor: Geir Instanes , Peter B. Nagy , Francesco Simonetti , Carson L. Willey
- Applicant: University Of Cincinnati , Cincinnati NDE, Ltd.
- Applicant Address: US OH Cincinnati US OH Cincinnati
- Assignee: University of Cincinnati,Cincinnati NDE, Ltd.
- Current Assignee: University of Cincinnati,Cincinnati NDE, Ltd.
- Current Assignee Address: US OH Cincinnati US OH Cincinnati
- Agency: Wood Herron & Evans LLP
- Main IPC: G01B17/02
- IPC: G01B17/02

Abstract:
Systems, methods and computer storage mediums accurately measure wall thickness in a region of interest included in complex curved structures. Embodiments of the present disclosure relate to generating a wall thickness loss distribution map of a region of interest that provides an accurate representation of wall thickness for the region of interest included in a complex curved structure. The wall thickness loss distribution map is generated from a two-dimensional model of the wall thickness loss distribution of the region of interest. The two-dimensional model is converted from a three-dimensional representation of the wall thickness loss distribution of the region of interest. The three-dimensional representation of the wall thickness is generated by ultrasonic waves generated by a transducer system that propagated through the region of interest.
Public/Granted literature
- US20170292835A1 MEASURING WALL THICKNESS LOSS FOR A STRUCTURE Public/Granted day:2017-10-12
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