Measuring wall thickness loss for a structure
Abstract:
Systems, methods and computer storage mediums accurately measure wall thickness in a region of interest included in complex curved structures. Embodiments of the present disclosure relate to generating a wall thickness loss distribution map of a region of interest that provides an accurate representation of wall thickness for the region of interest included in a complex curved structure. The wall thickness loss distribution map is generated from a two-dimensional model of the wall thickness loss distribution of the region of interest. The two-dimensional model is converted from a three-dimensional representation of the wall thickness loss distribution of the region of interest. The three-dimensional representation of the wall thickness is generated by ultrasonic waves generated by a transducer system that propagated through the region of interest.
Public/Granted literature
Information query
Patent Agency Ranking
0/0