Invention Grant
- Patent Title: Curvature measurement apparatus
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Application No.: US16145793Application Date: 2018-09-28
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Publication No.: US10704886B2Publication Date: 2020-07-07
- Inventor: Chuan Yu Zhang , Yue Zhuo , Dong Li , Rui Gong Zhang
- Applicant: Siemens Aktiengesellschaft
- Applicant Address: DE Munich
- Assignee: SIEMENS AKTIENGESELLSCHAFT
- Current Assignee: SIEMENS AKTIENGESELLSCHAFT
- Current Assignee Address: DE Munich
- Agency: Harness, Dickey & Pierce, P.L.C.
- Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@522da6a8
- Main IPC: G01B7/287
- IPC: G01B7/287 ; G06F3/01 ; G01B21/32 ; G01B7/16

Abstract:
An embodiment relates to a curvature measurement apparatus. The apparatus includes a first curvature measurement unit configured to, upon a curvature of an object to be measured being relatively greater than a first curvature, measure the curvature of the object to be measured; and a second curvature measurement unit configured to, upon the curvature of the object to be measured being relatively smaller than a second curvature, measure the curvature of the object to be measured, the second curvature being relatively greater than or equal to the first curvature. The curvature measurement apparatus can improve an accuracy of a curvature of an object to be measured.
Public/Granted literature
- US20190128658A1 CURVATURE MEASUREMENT APPARATUS Public/Granted day:2019-05-02
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