Invention Grant
- Patent Title: Method of inspecting gas supply system
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Application No.: US16010530Application Date: 2018-06-18
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Publication No.: US10692744B2Publication Date: 2020-06-23
- Inventor: Risako Miyoshi
- Applicant: TOKYO ELECTRON LIMITED
- Applicant Address: JP Tokyo
- Assignee: TOKYO ELECTRON LIMITED
- Current Assignee: TOKYO ELECTRON LIMITED
- Current Assignee Address: JP Tokyo
- Agency: Studebaker & Brackett PC
- Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@5631a0ac
- Main IPC: H01L21/67
- IPC: H01L21/67 ; G05D11/13 ; G05D16/20 ; H01J37/32 ; H01L21/683

Abstract:
In one embodiment, a vaporizer is connected to a chamber of a substrate processing apparatus through a gas supply line and a gas introduction port. An exhaust device is connected to the gas supply line. The substrate processing apparatus includes a pressure sensor that obtains a measurement value of a pressure of the gas supply line. A method according to the embodiment includes supplying a processing gas to the chamber from the vaporizer through the gas supply line, and monitoring a change of the measurement value obtained by the pressure sensor in a state in which supply of the processing gas to the gas supply line is stopped.
Public/Granted literature
- US20180374727A1 METHOD OF INSPECTING GAS SUPPLY SYSTEM Public/Granted day:2018-12-27
Information query
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