Invention Grant
- Patent Title: Apparatus and techniques for decelerated ion beam with no energy contamination
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Application No.: US16155469Application Date: 2018-10-09
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Publication No.: US10692697B2Publication Date: 2020-06-23
- Inventor: Frank Sinclair , Daniel Tieger , Klaus Becker
- Applicant: Varian Semiconductor Equipment Associates, Inc.
- Applicant Address: US MA Gloucester
- Assignee: Varian Semiconductor Equipment Associates, Inc.
- Current Assignee: Varian Semiconductor Equipment Associates, Inc.
- Current Assignee Address: US MA Gloucester
- Main IPC: H01J37/20
- IPC: H01J37/20 ; H01J37/317 ; H01J37/04

Abstract:
An ion implantation system may include an ion source to generate an ion beam, a substrate stage disposed downstream of the ion source; and a deceleration stage including a component to deflect the ion beam, where the deceleration stage is disposed between the ion source and substrate stage. The ion implantation system may further include a hydrogen source to provide hydrogen gas to the deceleration stage, wherein energetic neutrals generated from the ion beam are not scattered to the substrate stage.
Public/Granted literature
- US20190051493A1 APPARATUS AND TECHNIQUES FOR DECELERATED ION BEAM WITH NO ENERGY CONTAMINATION Public/Granted day:2019-02-14
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