A system for testing a data storage device includes the data storage device, an electronic device and a computer device. The electronic device includes a host device coupled to the data storage device and communicating with the data storage device via an interface logic. The computer device is coupled to the electronic device and is configured to issue a plurality of commands to test the data storage device in a test procedure. When the electronic device has been successfully started up, the computer device issues a first command to the electronic device to trigger the electronic device to enter a hibernate mode. After waiting for a first predetermined period of time, the computer device issues a second command to the electronic device, so as to wake up the electronic device.