- Patent Title: Grown defect detection and mitigation using ECC in memory systems
-
Application No.: US16022199Application Date: 2018-06-28
-
Publication No.: US10691539B2Publication Date: 2020-06-23
- Inventor: Ran Zamir , Eran Sharon , Idan Alrod
- Applicant: Western Digital Technologies, Inc.
- Applicant Address: US CA San Jose
- Assignee: WESTERN DIGITAL TECHNOLOGIES, INC.
- Current Assignee: WESTERN DIGITAL TECHNOLOGIES, INC.
- Current Assignee Address: US CA San Jose
- Agency: Dickinson Wright PLLC
- Agent Steven Hurles
- Main IPC: G06F11/10
- IPC: G06F11/10 ; G06F3/06

Abstract:
A controller may detect unreliable bits of data, memory cells, or bit lines during an error correction process of a read operation based on an error correction code used to generate parity bits for the data. In some embodiments, the controller may use the error correction code to determine a distribution of unsatisfied checks. Based on the distribution, the controller may detect group(s) of bits that more closely resemble a defective group of bits rather than a non-defective group of bits. Based on the detection, the controller may set reliability metrics to values that indicate low levels or reliability, which in turn may increase the probability of successfully correcting the errors and reduce the amount of work the controller needs to do in order to complete the error correction process.
Public/Granted literature
- US20200004629A1 GROWN DEFECT DETECTION AND MITIGATION USING ECC IN MEMORY SYSTEMS Public/Granted day:2020-01-02
Information query