- Patent Title: Method for testing the die-attach of a photovoltaic cell assembly
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Application No.: US15576658Application Date: 2016-05-17
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Publication No.: US10686404B2Publication Date: 2020-06-16
- Inventor: Eckart Gerster , Hannes Meyer-Schönbohm
- Applicant: Saint-Augustin Canada Electric Inc.
- Applicant Address: CA Quebec
- Assignee: Saint-Augustin Canada Electric Inc.
- Current Assignee: Saint-Augustin Canada Electric Inc.
- Current Assignee Address: CA Quebec
- Agency: TraskBritt
- Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@38ab32f0
- International Application: PCT/EP2016/060956 WO 20160517
- International Announcement: WO2016/188786 WO 20161201
- Main IPC: H02J7/00
- IPC: H02J7/00 ; H02S50/10

Abstract:
A method for testing the die-attach quality of a photovoltaic cell assembly, in particular, for electrical inline monitoring of a photovoltaic cell die-attach quality during the manufacturing of a concentrator photovoltaic module, comprises the steps of providing a photovoltaic cell assembly comprising at least one photovoltaic cell, in particular, a concentrator photovoltaic cell, attached to a heat sink, injecting a current into the photovoltaic cell assembly, measuring the voltage across the photovoltaic cell during the current injection, and determining the relative voltage drop over the duration of the current injection, whereby insufficiently bonded photovoltaic cell assemblies can be identified and screened.
Public/Granted literature
- US20180123511A1 METHOD FOR TESTING THE DIE-ATTACH OF A PHOTOVOLTAIC CELL ASSEMBLY Public/Granted day:2018-05-03
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