Invention Grant
- Patent Title: High isolation contactor with test pin and housing for integrated circuit testing
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Application No.: US16140853Application Date: 2018-09-25
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Publication No.: US10686269B2Publication Date: 2020-06-16
- Inventor: Jeffrey Sherry , Michael Andres
- Applicant: Johnstech International Corporation
- Applicant Address: US MN Minneapolis
- Assignee: JOHNSTECH INTERNATIONAL CORPORATION
- Current Assignee: JOHNSTECH INTERNATIONAL CORPORATION
- Current Assignee Address: US MN Minneapolis
- Agency: Hamre, Schumann, Mueller & Larson, P.C.
- Main IPC: H01R12/70
- IPC: H01R12/70 ; G01R31/28 ; H01R12/82 ; G01R1/04 ; H01R13/24
Abstract:
A test socket (14) for a testing an integrated circuit (12) with controlled impedance while maintaining the structural integrity of the test pins (20). The pin (20) can have a sidewall with a thick portion 32 and a thinner portion (30) along the length of the pin. The pin can have projections (42) which provide a standoff from the slot (40). The sidewalls themselves can have projections or lands (60, 61) which extend into the slot and provide stability for the pin (20).
Public/Granted literature
- US20190097333A1 High Isolation Contactor with Test Pin and Housing For Integrated Circuit Testing Public/Granted day:2019-03-28
Information query
