Invention Grant
- Patent Title: Anti-fuse one-time programmable (OTP) device
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Application No.: US15399243Application Date: 2017-01-05
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Publication No.: US10685968B2Publication Date: 2020-06-16
- Inventor: Jihoon Yoon , Hyun-Min Choi
- Applicant: Samsung Electronics Co., Ltd.
- Applicant Address: KR Gyeonggi-do
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Gyeonggi-do
- Agency: Harness, Dickey & Pierce, P.L.C.
- Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@3afae68d
- Main IPC: H01L27/112
- IPC: H01L27/112 ; H01L23/525 ; H01L23/522

Abstract:
A semiconductor device is disclosed. The semiconductor device including writing and reading gate electrodes respectively on first and second active regions on a substrate, a first gate insulation pattern between the first active region and the writing gate electrode, a second gate insulation pattern between the second active region and the reading gate electrode, first and second source/drain junction regions in the first and second active regions at sides of the writing and reading gate electrodes, and a connection structure that connects the first and second source/drain junction regions. The first active region has the same conductivity type as the source/drain junction regions. The second active region has a different conductivity type from the source/drain junction regions.
Public/Granted literature
- US20170200727A1 SEMICONDUCTOR DEVICES Public/Granted day:2017-07-13
Information query
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