Invention Grant
- Patent Title: Specimen inspection automation system
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Application No.: US15758355Application Date: 2016-08-19
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Publication No.: US10684302B2Publication Date: 2020-06-16
- Inventor: Shigeki Yamaguchi , Shigeru Yano , Toshiki Yamagata , Hiroki Ihara
- Applicant: HITACHI HIGH-TECHNOLOGIES CORPORATION
- Applicant Address: JP Tokyo
- Assignee: HITACHI HIGH-TECH CORPORATION
- Current Assignee: HITACHI HIGH-TECH CORPORATION
- Current Assignee Address: JP Tokyo
- Agency: Mattingly & Malur, PC
- Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@73077752
- International Application: PCT/JP2016/074238 WO 20160819
- International Announcement: WO2017/051642 WO 20170330
- Main IPC: G01N35/04
- IPC: G01N35/04 ; G01N35/02 ; G01N35/00

Abstract:
This specimen inspection automation system is provided with: a processing unit which processes a specimen; a conveying line which conveys carriers; a control device which controls the conveying of the carriers; and external connection modules which deliver the carriers to and from external devices. The control device controls the number of carriers in the specimen inspection automation system within a fixed range on the basis of the number of carriers conveyed into and out of the system by the external connection modules.
Public/Granted literature
- US20180246131A1 SPECIMEN INSPECTION AUTOMATION SYSTEM Public/Granted day:2018-08-30
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