Aspects of the present disclosure are directed to generating endurance measures for a memory sub-system and using endurance measures to classify memory sub-systems, to predict memory system remaining life, and to create memory systems with consistently performing sub-systems. An endurance measure can be generated by computing multiple metric points. Each metric point can be based on a margin between a point, in cumulative distribution function (CDF)-based data at an acceptable memory unit failure rate, and an error amount threshold condition. Once a there are sufficient metric points related to the memory device, the metric points can be fit to a function. The endurance measure is then obtained by extrapolating the function to a point at which the function reaches a threshold.