Invention Grant
- Patent Title: Edge detection system and its use for machine learning
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Application No.: US16415921Application Date: 2019-05-17
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Publication No.: US10664955B2Publication Date: 2020-05-26
- Inventor: Chris Mack
- Applicant: FRACTILIA, LLC
- Applicant Address: US TX Austin
- Assignee: FRACTILIA, LLC
- Current Assignee: FRACTILIA, LLC
- Current Assignee Address: US TX Austin
- Agency: Dickinson Wright PLLC
- Main IPC: G06T5/00
- IPC: G06T5/00 ; G06T5/50 ; G06T7/13 ; G06F17/18 ; G06N20/00

Abstract:
Systems and methods are disclosed that remove noise from roughness measurements to determine roughness of a feature in a pattern structure. In one embodiment, a method includes generating, using an imaging device, a set of one or more images, each including an instance of a feature within a respective pattern structure. The method also includes detecting edges of the features within the pattern structure of each image using an inverse linescan model, generating a biased power spectral density (PSD) dataset representing feature geometry information corresponding to the edge detection measurements, evaluating a high-frequency portion of the biased PSD dataset to determine a noise model for predicting noise over all frequencies of the biased PSD dataset, and subtracting the noise predicted by the determined noise model from a biased roughness measure to obtain an unbiased roughness measure provided as part of a training data set to a machine learning model.
Public/Granted literature
- US20190272623A1 EDGE DETECTION SYSTEM AND ITS USE FOR MACHINE LEARNING Public/Granted day:2019-09-05
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