Invention Grant
- Patent Title: Baseline shift determination for a photon detector
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Application No.: US15534528Application Date: 2015-12-10
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Publication No.: US10660589B2Publication Date: 2020-05-26
- Inventor: Ewald Roessl
- Applicant: KONINKLIJKE PHILIPS N.V.
- Applicant Address: NL Eindhoven
- Assignee: KONINKLIJKE PHILIPS N.V.
- Current Assignee: KONINKLIJKE PHILIPS N.V.
- Current Assignee Address: NL Eindhoven
- Agent Larry Liberchuk
- Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@2db12fee
- International Application: PCT/EP2015/079181 WO 20151210
- International Announcement: WO2016/096580 WO 20160623
- Main IPC: A61B6/03
- IPC: A61B6/03 ; G01T1/24 ; A61B6/00 ; G01T1/40 ; G01T7/00 ; H05G1/30
Abstract:
The present invention relates to determining baseline shift of an electrical signal generated by a photon detector (102) of an X-ray examination device (101). For this purpose, the photon detector comprises a processing unit (103) that is configured to determine a first crossing frequency of a first pulse height threshold by the electrical signal generated by the photon detector. The first pulse height threshold is located at a first edge of a noise peak in the pulse height spectrum of the electrical signal.
Public/Granted literature
- US20170322329A1 BASELINE SHIFT DETERMINATION FOR A PHOTON DETECTOR Public/Granted day:2017-11-09
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