- Patent Title: System and method for verifying integrity of an electronic device
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Application No.: US15718712Application Date: 2017-09-28
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Publication No.: US10659237B2Publication Date: 2020-05-19
- Inventor: Yongzheng Wu , Xuejun Wen , Chengfang Fang , Tieyan Li
- Applicant: Huawei International Pte. Ltd.
- Applicant Address: SG Singapore
- Assignee: Huawei International Pte. Ltd.
- Current Assignee: Huawei International Pte. Ltd.
- Current Assignee Address: SG Singapore
- Agency: Leydig, Voit & Mayer, Ltd.
- Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@6a629745
- Main IPC: H04L9/32
- IPC: H04L9/32 ; G06F21/70 ; G06F21/57 ; G06F21/83

Abstract:
This document discloses a system and method for verifying system integrity of an electronic device. The electronic device includes a verifier device provided within a secure environment of the electronic device and a scanner device provided within a normal environment of the electronic device whereby the secure environment comprises hardware that is isolated from the hardware in the normal environment, i.e. these two environments are hardware isolated.
Public/Granted literature
- US20180019880A1 SYSTEM AND METHOD FOR VERIFYING INTEGRITY OF AN ELECTRONIC DEVICE Public/Granted day:2018-01-18
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