Invention Grant
- Patent Title: Methods and apparatus for driver calibration
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Application No.: US16002179Application Date: 2018-06-07
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Publication No.: US10658986B2Publication Date: 2020-05-19
- Inventor: Seiji Takeuchi
- Applicant: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
- Applicant Address: US AZ Phoenix
- Assignee: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
- Current Assignee: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
- Current Assignee Address: US AZ Phoenix
- Agency: The Noblitt Group, PLLC
- Agent Hettie L. Haines
- Main IPC: H03F1/30
- IPC: H03F1/30 ; G03B13/36 ; G05F3/24 ; H02P25/034 ; H03F3/45 ; H03M1/10

Abstract:
Various embodiments of the present technology may comprise methods and apparatus for driver calibration. The methods and apparatus may comprise various circuits and/or systems to minimize an offset output current (e.g., a drive current) due to an offset voltage in an operational amplifier. The methods and apparatus may comprise a current comparator circuit and a replica circuit that operate in conjunction with each other to monitor the drive current and provide a feedback signal, which is then used to adjust the drive current and improve the accuracy of the drive current.
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