Invention Grant
- Patent Title: Package structure and method of fabricating the same
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Application No.: US16199230Application Date: 2018-11-26
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Publication No.: US10658333B2Publication Date: 2020-05-19
- Inventor: Hsien-Wei Chen , Ming-Fa Chen , Sung-Feng Yeh
- Applicant: Taiwan Semiconductor Manufacturing Co., Ltd.
- Applicant Address: TW Hsinchu
- Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.
- Current Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.
- Current Assignee Address: TW Hsinchu
- Agency: JCIPRNET
- Main IPC: H01L23/02
- IPC: H01L23/02 ; H01L25/065 ; H01L21/56 ; H01L23/498 ; H01L23/31 ; H01L23/00 ; H01L23/48

Abstract:
A package structure includes at least one semiconductor die, an insulating encapsulant, an isolation layer and a redistribution layer. The at least one first semiconductor die has a semiconductor substrate and a conductive post disposed on the semiconductor substrate. The insulating encapsulant is partially encapsulating the first semiconductor die, wherein the conductive post has a first portion surrounded by the insulating encapsulant and a second portion that protrudes out from the insulating encapsulant. The isolation layer is disposed on the insulating encapsulant and surrounding the second portion of the conductive post. The redistribution layer is disposed on the first semiconductor die and the isolation layer, wherein the redistribution layer is electrically connected to the conductive post of the first semiconductor die.
Public/Granted literature
- US20200043893A1 PACKAGE STRUCTURE AND METHOD OF FABRICATING THE SAME Public/Granted day:2020-02-06
Information query
IPC分类: