Invention Grant
- Patent Title: Package structure with warpage-control element
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Application No.: US16398119Application Date: 2019-04-29
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Publication No.: US10658323B2Publication Date: 2020-05-19
- Inventor: Hao-Jan Pei , Chih-Chiang Tsao , Wei-Yu Chen , Hsiu-Jen Lin , Ming-Da Cheng , Ching-Hua Hsieh , Chung-Shi Liu
- Applicant: Taiwan Semiconductor Manufacturing Co., Ltd
- Applicant Address: TW Hsinchu
- Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.
- Current Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.
- Current Assignee Address: TW Hsinchu
- Agency: Birch, Stewart, Kolasch & Birch, LLP
- Main IPC: H01L21/00
- IPC: H01L21/00 ; H01L23/00 ; H01L25/11 ; H01L25/10 ; H01L23/29 ; H01L21/56 ; H01L23/31 ; H01L21/683

Abstract:
A package structure is provided. The package structure includes a semiconductor die and a protective layer surrounding the semiconductor die. The package structure also includes a conductive structure and a warpage-control element over a same side of the protective layer. A bottom surface of the warpage-control element is higher than a bottom surface of the conductive structure. The bottom surface of the warpage-control element is lower than a top surface of the conductive bump.
Public/Granted literature
- US20190252340A1 PACKAGE STRUCTURE WITH WARPAGE-CONTROL ELEMENT Public/Granted day:2019-08-15
Information query
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