Invention Grant
- Patent Title: Method and structure of middle layer removal
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Application No.: US16104637Application Date: 2018-08-17
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Publication No.: US10658179B2Publication Date: 2020-05-19
- Inventor: Nai-Chia Chen , Wan Hsuan Hsu , Chia-Wei Wu , Neng-Jye Yang , Chun-Li Chou
- Applicant: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
- Applicant Address: TW Hsinchu
- Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.
- Current Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.
- Current Assignee Address: TW Hsinchu
- Agency: Birch, Stewart, Kolasch & Birch, LLP
- Main IPC: H01L21/033
- IPC: H01L21/033 ; H01L21/02 ; H01L21/3065 ; H01L21/3105 ; H01L21/311 ; H01L21/027 ; H01L21/3213

Abstract:
Aspects of the disclosure provide a method. The method includes providing a substrate having a structure formed on the substrate, and forming a spacer layer on the structure. Then, the method includes forming a mask layer over the spacer layer. The mask layer includes a first layer, a second layer over the first layer, and a third layer over the second layer. Further, the method includes patterning the third layer of the mask layer, and etching the first layer and the second layer of the mask layer with a dry etching process using the third layer as an etch mask to form an opening that exposes a portion of the spacer layer. Then, the method includes removing the second layer using a wet etchant before a formation of a backfill material layer in the opening and over the first layer.
Public/Granted literature
- US20200058502A1 METHOD AND STRUCTURE OF MIDDLE LAYER REMOVAL Public/Granted day:2020-02-20
Information query
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