Invention Grant
- Patent Title: First-pass continuous read level calibration
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Application No.: US16122380Application Date: 2018-09-05
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Publication No.: US10658066B2Publication Date: 2020-05-19
- Inventor: Michael Sheperek , Larry J. Koudele , Bruce A. Liikanen
- Applicant: Micron Technology, Inc.
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Lowenstein Sandler LLP
- Main IPC: H04L7/00
- IPC: H04L7/00 ; G11C29/50 ; H04L1/20 ; G11C7/10 ; G11C16/10 ; G11C16/34

Abstract:
Described herein are embodiments related to first-pass continuous read level calibration (cRLC) operations on memory cells of memory systems. A processing device determines that a first programming pass of a programming operation has been performed on a memory cell of a memory component. The processing device performs a cRLC operation on the memory cell to calibrate a read level threshold between a first first-pass programming distribution and a second first-pass programming distribution before a second programming pass of the programming operation is performed on the memory cell.
Public/Granted literature
- US20200075120A1 FIRST-PASS CONTINUOUS READ LEVEL CALIBRATION Public/Granted day:2020-03-05
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