Invention Grant
- Patent Title: Self testing fault circuit apparatus and method
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Application No.: US15650369Application Date: 2017-07-14
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Publication No.: US10656199B2Publication Date: 2020-05-19
- Inventor: Michael Ostrovsky , Adam Kevelos
- Applicant: Leviton Manufacturing Company
- Applicant Address: US NY Melville
- Assignee: Leviton Manufacturing Company, Inc.
- Current Assignee: Leviton Manufacturing Company, Inc.
- Current Assignee Address: US NY Melville
- Agency: Foley & Lardner LLP
- Main IPC: G01R31/28
- IPC: G01R31/28 ; H02H3/33 ; G01R31/327
Abstract:
A process for self testing a fault circuit includes disabling an actuator, performing a self test by creating a simulated fault signal across at least a portion of a half cycle of a first polarity and across at least a portion of a half cycle of a second polarity, and determining whether the self test was successful.
Public/Granted literature
- US20170322254A1 SELF TESTING FAULT CIRCUIT APPARATUS AND METHOD Public/Granted day:2017-11-09
Information query
