Invention Grant
- Patent Title: Dispersoid particle analyzing method and analyzing apparatus
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Application No.: US15739495Application Date: 2016-06-24
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Publication No.: US10656119B2Publication Date: 2020-05-19
- Inventor: Makoto Kawano
- Applicant: KAWANO Lab. Inc.
- Applicant Address: JP Osaka
- Assignee: KAWANO Lab. Inc.
- Current Assignee: KAWANO Lab. Inc.
- Current Assignee Address: JP Osaka
- Agency: Studebaker & Brackett PC
- Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@44c9b8d
- International Application: PCT/JP2016/068850 WO 20160624
- International Announcement: WO2016/208724 WO 20161229
- Main IPC: G01N27/76
- IPC: G01N27/76 ; G01N15/06 ; G01N15/08 ; G01N15/10 ; G01N15/14

Abstract:
A volume susceptibility (χs1) of a first dispersoid particle (s1) is obtained. A second dispersoid particle (s2) that is the first dispersoid particle (s1) to which an adsorbate is adsorbed is obtained. A volume susceptibility (χs2) of the second dispersoid particle (s2) is obtained. An amount of a functional group of the first dispersoid particle (s1) is analyzed through obtaining an amount of the adsorbate included in the second dispersoid particle (s2) based on the volume susceptibilities (χs1) and (χs2) of the first and second dispersoid particles (s1) and (s2).
Public/Granted literature
- US20180196004A1 DISPERSOID PARTICLE ANALYZING METHOD AND ANALYZING APPARATUS Public/Granted day:2018-07-12
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