Invention Grant
- Patent Title: Non-linear dose- and blur-dependent edge placement correction
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Application No.: US16239061Application Date: 2019-01-03
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Publication No.: US10651010B2Publication Date: 2020-05-12
- Inventor: Elmar Platzgummer , Christoph Spengler , Wolf Naetar
- Applicant: IMS Nanofabrication GmbH
- Applicant Address: AT Vienna
- Assignee: IMS Nanofabrication GmbH
- Current Assignee: IMS Nanofabrication GmbH
- Current Assignee Address: AT Vienna
- Agency: KPPB LLP
- Main IPC: H01J37/302
- IPC: H01J37/302 ; H01J37/317

Abstract:
A rasterized exposure method implementing a position correction for edge positions to correct for a non-linear relationship between the position of a feature edge (dCD) of a pattern element boundary and the nominal position of the boundary as expressed through the dose of exposure (d) of the edge pixel is provided. The position correction includes: determining a position value of the edge position, determining a corrected position value based on the position value using a predefined non linear function, and modifying the pattern to effectively shift the pattern element boundary in accordance with the corrected position value. The non linear function describes the inverse of the relationship between a nominal position value (d), which is used as input value during exposure of the pattern, and a resulting position (dCD) of the pattern element boundary generated when exposed with the nominal position value.
Public/Granted literature
- US20190214226A1 Non-linear Dose- and Blur-Dependent Edge Placement Correction Public/Granted day:2019-07-11
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