A method of examining a cryogenic specimen in a Charged Particle Microscope, comprising: Providing the specimen in a cryogenic cell on a specimen holder; Directing a charged particle beam from a source and along an axis through an evacuated beam conduit of an illuminator system so as to irradiate at least a portion of the specimen therewith; Using a detector to detect radiation emanating from the specimen in response to said irradiation, further comprising: Configuring said cell to comprise an elongate tube that extends within said beam conduit into said illuminator system and encloses said axis; Maintaining said tube at a cryogenic temperature at least during said irradiation.