Invention Grant
- Patent Title: Optical analysis apparatus, optical analysis system, and optical analysis method
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Application No.: US15884231Application Date: 2018-01-30
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Publication No.: US10627348B2Publication Date: 2020-04-21
- Inventor: Takuya Kanbayashi , Shinichi Taniguchi , Akihiro Nojima
- Applicant: Hitachi, Ltd.
- Applicant Address: JP Tokyo
- Assignee: Hitachi, Ltd.
- Current Assignee: Hitachi, Ltd.
- Current Assignee Address: JP Tokyo
- Agency: Procopio, Cory, Hargreaves & Savitch LLP
- Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@310290cd
- Main IPC: G01N21/59
- IPC: G01N21/59 ; G01N1/28 ; G01N21/03 ; G01N21/53

Abstract:
An optical analysis apparatus, that irradiates a liquid sample with light and analyzes the sample, includes a measurement unit that measures the sample, a light source portion that emits light with which the sample is irradiated, and a light receiving portion that receives the light transmitted through the sample. The measurement unit includes a housing provided with an opening portion for flowing in and out of the sample, an accommodation region connected to the opening portion and provided inside the housing, a movable portion provided inside the accommodation region to be movable inside the accommodation region, an irradiation portion which receives the light emitted from the light source portion and in which an inside of the accommodation region is irradiated with the light, and a light collection portion which collects the light transmitted through the sample inside the accommodation region and outputs the light to the light receiving portion.
Public/Granted literature
- US10663399B2 Optical analysis apparatus, optical analysis system, and optical analysis method Public/Granted day:2020-05-26
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