Invention Grant
- Patent Title: Selectively etched self-aligned via processes
-
Application No.: US16216247Application Date: 2018-12-11
-
Publication No.: US10593594B2Publication Date: 2020-03-17
- Inventor: Yung-Chen Lin , Qingjun Zhou , Ying Zhang , Ho-yung David Hwang , Uday Mitra , Regina Freed
- Applicant: Micromaterials LLC
- Applicant Address: US DE Wilmington
- Assignee: Micromaterials LLC
- Current Assignee: Micromaterials LLC
- Current Assignee Address: US DE Wilmington
- Agency: Servilla Whitney LLC
- Main IPC: H01L21/768
- IPC: H01L21/768 ; H01L21/311

Abstract:
Methods of forming a self-aligned via comprising recessing a first metallization layer comprising a set of first conductive lines that extend along a first direction on a first insulating layer on a substrate. A second insulating layer is formed on the first insulating layer. A via is formed through the second insulating layer to one of the first conductive lines. Semiconductor devices comprising the self-aligned via and apparatus for forming the self-aligned via are also disclosed.
Public/Granted literature
- US20190189510A1 Selectively Etched Self-Aligned Via Processes Public/Granted day:2019-06-20
Information query
IPC分类: