Invention Grant
- Patent Title: Device for modulating the intensity of a particle beam from a charged particle source
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Application No.: US16082352Application Date: 2017-03-08
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Publication No.: US10586675B2Publication Date: 2020-03-10
- Inventor: Pierre Salou , Daniel Fink
- Applicant: PANTECHNIK , A.D.A.M. SA
- Applicant Address: FR Bayeux CH Meyrin
- Assignee: PANTECHNIK,A.D.A.M. SA
- Current Assignee: PANTECHNIK,A.D.A.M. SA
- Current Assignee Address: FR Bayeux CH Meyrin
- Agency: Bachman & LaPointe, P.C.
- Priority: FR1651912 20160308
- International Application: PCT/FR2017/050510 WO 20170308
- International Announcement: WO2017/153680 WO 20170914
- Main IPC: G21K5/04
- IPC: G21K5/04 ; H05H7/04 ; H05H7/08 ; G21K1/087 ; G21K1/093 ; H01J37/04 ; H01J37/147

Abstract:
A device for modulating the intensity of a charged particle beam emitted along an axis, comprises 4×N consecutive deflection systems, with N=1 or 2, with the deflection systems being positioned along the axis of said particle beam, and being capable of deflecting the beam relative to the axis in the same direction, with alternating directions of deflection, for two consecutive systems, means for applying a force for deflecting the beam for each deflection system and for varying the applied force; two collimators each having a slot with an opening that increases in width from the center towards the periphery, located respectively between the first and second deflection systems and between the third and fourth deflection systems, with the opening of the slot of the first collimator facing towards one side of the emission axis of the beam, with the opening of the slot of the second collimator facing towards the opposite side of the emission axis of the beam.
Public/Granted literature
- US20190080880A1 DEVICE FOR MODULATING THE INTENSITY OF A PARTICLE BEAM FROM A CHARGED PARTICLE SOURCE Public/Granted day:2019-03-14
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