- Patent Title: Test system and method for benchmark testing a device under test
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Application No.: US15487864Application Date: 2017-04-14
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Publication No.: US10581695B2Publication Date: 2020-03-03
- Inventor: Hanush Khurana , Rajashekar Durai , Prabhakaran Ekambaram
- Applicant: Rohde & Schwarz GmbH & Co. KG
- Applicant Address: DE Munich
- Assignee: Rohde & Schwarz GmbH & Co. KG
- Current Assignee: Rohde & Schwarz GmbH & Co. KG
- Current Assignee Address: DE Munich
- Agency: Christensen O'Connor Johnson Kindness PLLC
- Main IPC: G06F15/16
- IPC: G06F15/16 ; H04L12/24 ; H04L12/26

Abstract:
A test system for benchmark testing a device under test is described. The test system comprises a device under test having hardware components, an operating system and at least one over-the-top traffic unit. The test system also has at least one network unit providing a network for the benchmark testing. The test system further comprises at least one control unit controlling the benchmark testing. In addition, the test system has at least one measurement unit configured to acquire benchmark data of the device under test. The control unit is configured to control the measurement unit and the over-the-top traffic unit. Further, a method for benchmark testing a device under test is described.
Public/Granted literature
- US20180302292A1 TEST SYSTEM AND METHOD FOR BENCHMARK TESTING A DEVICE UNDER TEST Public/Granted day:2018-10-18
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