Invention Grant
- Patent Title: Systems and methods for determining a spatial radiation characteristic of a transmitted radio-frequency signal
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Application No.: US15243425Application Date: 2016-08-22
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Publication No.: US10581162B2Publication Date: 2020-03-03
- Inventor: Ken A Nishimura
- Applicant: Keysight Technologies, Inc.
- Applicant Address: US CA Santa Rosa
- Assignee: Keysight Technologies, Inc.
- Current Assignee: Keysight Technologies, Inc.
- Current Assignee Address: US CA Santa Rosa
- Main IPC: H01Q3/26
- IPC: H01Q3/26 ; H01Q3/34 ; H01Q15/16

Abstract:
In an exemplary embodiment, an RF device includes a receiver and an antenna. The antenna is configured to receive a reflected radio-frequency signal containing a set of modulated signal segments. Each modulated signal segment has a unique modulation pattern that indicates a time-variant reflectivity characteristic of a respective signal reflecting tile of a radio-frequency signal reflector. The receiver can include a circuit to process the modulated signal segments and determine a spatial intensity distribution of the radio-frequency signal incident upon the radio-frequency signal reflector. The spatial intensity distribution can be used by the circuit to determine a spatial radiation characteristic of an RF signal that is transmitted by a transmitter in order to produce the reflected radio-frequency signal. The transmitter, which can be incorporated into the RF device, includes a beam steering circuit that can modify a spatial radiation characteristic of the transmitted RF signal for addressing a misalignment.
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